Near Infrared Imaging

Short Description   /   Home made

Contacts :   THOMASSET   Muriel     /   BOSSEBOEUF   Alain   /   COSTE   Philippe

Location : E18

  • Space
    Near Infrared Imaging

Caractéristiques

  • Field of view   :   diameter : 100 mm
Applications

Defects observation

High defective Si-Si wafer bonding

  • Space

Contacts : alain.bosseboeuf@c2n.upsaclay.fr