Centre for Nanoscience
and Nanotechnology

  • CNRS

Multiphysics Platform

Plateforme Multi Physique

The multiphysics characterisation platform is a multi-users platform open for research, education and to external academic or industrial laboratories. The 100m2 ISO7 cleanroom houses equipment purchased, modified or developed to characterize microfabrication and packaging processes, films and microdevices. The main available set-ups notably include:

  • Optical microscopy and imaging: Visible, near-inrared and DUV optical microscopes, IR microphotoelasticity in reflection mode, IR microthermography, and a system of defects inspection of bonded wafers by NIR imaging in transmision.
  • Optical profilometers and/or vibrometers: Several full field interferometric profilometers-vibrometers with a (sub)nanometer vertical resolution having various fields of view and wavelengths, a fibered differential laser Doppler vibrometer mounted on a microscope and a stroboscopic microscope with sub-pixel image processing for in plane nanometric displacement of vibration measurements of microstructures. Several vacuum chambers and accessories allow measurements under probes, as function of temperature or pressure, etc.
  • Micromechanical test benches: a Femtotools mechanical probe, Bulge test, blade test and a miniaturized 4 point bending system.
  • Electrical measurement systems as function of temperature: A 4 probe sheet resistance measurement set-up under vacuum and as function of temperature and gaseous environment (N2, 16O2, H2, D2, 18O2, dry air) and a cryogenic probe station for piezoresistance measurement by in-situ 4 point bending or of thermal conductivity measurements by 3 omega method.
 

Key Figures

  • 13 state-of-the-art equipments
  • 100 m2 ISO7 clean-room

Platform Manager

  • THOMASSET Muriel (Plateforme d'Innovation en Micro et Nano Technologies)
  • COSTE Philippe (Département Microsystèmes et nanobiofluidique)

News

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Microscopy et Imaging

Imaging, microscopy using NIR, Visible or UV light.

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Mechanical and Electrical Characterization

Function of temperature and gazeous atmosphere possible

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Optical Profilometry and Vibrometry

3D profilometry on microsystems using white-light or phase shifting interferometry. Vibrometry using averaged-mode or Doppler interferometry.

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